Real-time, high-resolution x-ray diffraction measurements on shocked crystals at a synchrotron facility
Crossref DOI link: https://doi.org/10.1063/1.4772577
Published Online: 2012-12-21
Published Print: 2012-12-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Gupta, Y. M.
Turneaure, Stefan J.
Perkins, K.
Zimmerman, K.
Arganbright, N.
Shen, G.
Chow, P.
Funding for this research was provided by:
U.S. Department of Energy (DE-AC02-06CH11357, DE-FG03-97SF21388, DE-FG52-97SF21388, DE-NA0000970)