Defect enhanced funneling of diffusion current in silicon
Crossref DOI link: https://doi.org/10.1063/1.4789849
Published Online: 2013-01-29
Published Print: 2013-01-28
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Azimi, S.
Dang, Z. Y.
Song, J.
Breese, M. B. H.
Vittone, E.
Forneris, J.