Boron-oxygen defect imaging in p-type Czochralski silicon
Crossref DOI link: https://doi.org/10.1063/1.4819096
Published Online: 2013-08-27
Published Print: 2013-08-26
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Lim, S. Y.
Rougieux, F. E.
Macdonald, D.