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High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles

Crossref DOI link: https://doi.org/10.1039/C4RA05092D

Published Online: 2014-10-07

Update policy: https://doi.org/10.1039/rsc_crossmark_policy

Authors

Rades, Steffi

Hodoroaba, Vasile-Dan

Salge, Tobias

Wirth, Thomas

Lobera, M. Pilar

Labrador, Roberto Hanoi

Natte, Kishore

Behnke, Thomas

Gross, Thomas

Unger, Wolfgang E. S.
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OPEN ACCESS: This article is freely available. This article is licensed under a Creative Commons Attribution 3.0 Unported Licence (CC BY 3.0)

PUBLICATION HISTORY

: Received 29 May 2014; Accepted 17 September 2014; Version of Record published 7 October 2014

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