Prakash, Gokul
Gray, Jennifer L
Lee, Yong Su
Kanicki, J
Journal title: Semiconductor Science and Technology
Article type: paper
Article title: Comparison of composition and atomic structure of amorphous indium gallium zinc oxide thin film transistor before and after positive bias temperature stress by transmission electron microscopy
Copyright information: © 2015 IOP Publishing Ltd
Publication dates
Date received: 2014-10-08
Date accepted: 2015-03-11
Online publication date: 2015-04-07