Crossmark

Electrical characteristics of p-Si/TiO <sub>2</sub> /Al and p-Si/TiO <sub>2</sub> -Zr/Al Schottky devices

Crossref DOI link: https://doi.org/10.1080/14786435.2016.1178403

Published Online: 2016-05-02

Published Print: 2016-06-02

Update policy: https://doi.org/10.1080/tandf_crossmark_01

Authors

Taşdemir, İbrahim Hüdai

Vural, Özkan

Dökme, İlbilge
Funding

Funding for this research was provided by:

Amasya University, Scientifict Research Unit (FMB-BAP 13-058)

Amasya University, Scientifict Research Unit (FMB-BAP 14-069)
More Information

Peer Review Statement: The publishing and review policy for this title is described in its Aims & Scope.

Aim & Scope: http://www.tandfonline.com/action/journalInformation?show=aimsScope&journalCode=tphm20

Publication History

Received: 2015-12-18

Accepted: 2016-04-08

Published: 2016-05-02