Maejima, Naoyuki
Horita, Masahiro
Matsui, Hirosuke
Matsushita, Tomohiro
Daimon, Hiroshi
Matsui, Fumihiko
Article Title: Interfacial atomic site characterization by photoelectron diffraction for 4H-AlN/4H-SiC( ) heterojunction
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2016 The Japan Society of Applied Physics
Publication dates
Date Received: 2016-03-02
Date Accepted: 2016-05-06
Online publication date: 2016-07-06