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Defects, stoichiometry, and electronic transport in SrTiO3-δ epilayers: A high pressure oxygen sputter deposition study

Crossref DOI link: https://doi.org/10.1063/1.4960343

Published Online: 2016-08-04

Published Print: 2016-08-07

Update policy: https://doi.org/10.1063/aip-crossmark-policy-page

Authors

Ambwani, P.

Xu, P. https://orcid.org/0000-0002-0169-4708
Haugstad, G.

Jeong, J. S.

Deng, R. https://orcid.org/0000-0002-9308-5765
Mkhoyan, K. A.

Jalan, B. https://orcid.org/0000-0002-7940-0490
Leighton, C.
Funding

Funding for this research was provided by:

Division of Materials Research (DMR-1420013)

U.S. Department of Energy (DE-FG02-06ER46275)