Performance degradation of superlattice MOSFETs due to scattering in the contacts
Crossref DOI link: https://doi.org/10.1063/1.4971341
Published Online: 2016-12-08
Published Print: 2016-12-14
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Long, Pengyu
Huang, Jun Z.
Jiang, Zhengping
Klimeck, Gerhard
Rodwell, Mark J. W.
Povolotskyi, Michael
Funding for this research was provided by:
National Science Foundation (EEC-0228390, EEC-0634750, EEC-1227110, EEC-1509394, OCI-0438246, OCI-0721680, OCI-0749140, OCI-0832623)