Hwang, Sunghwan
Han, Chang Wan
Venkatakrishnan, Singanallur V
Bouman, Charles A
Ortalan, Volkan
Journal title: Measurement Science and Technology
Article type: paper
Article title: Towards the low-dose characterization of beam sensitive nanostructures via implementation of sparse image acquisition in scanning transmission electron microscopy
Copyright information: © 2017 IOP Publishing Ltd
Publication dates
Date received: 2016-08-23
Date accepted: 2017-01-09
Online publication date: 2017-02-10