Transient thermal analysis of semiconductor diode lasers under pulsed operation
Crossref DOI link: https://doi.org/10.1063/1.4977183
Published Online: 2017-02-21
Published Print: 2017-02-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Veerabathran, G. K.
Sprengel, S.
Karl, S.
Andrejew, A.
Schmeiduch, H.
Amann, M.-C.
Funding for this research was provided by:
German excellence cluster"Nano-initiative Munich"