Crossmark

Oxidation of rubrene, and implications for device stability

Crossref DOI link: https://doi.org/10.1039/C7TC05775J

Published Online: 2018

Update policy: https://doi.org/10.1039/rsc_crossmark_policy

Authors

Ly, Jack T.

Lopez, Steven A. https://orcid.org/0000-0002-8418-3638
Lin, Janice B. https://orcid.org/0000-0002-9333-5760
Kim, Jae Joon

Lee, Hyunbok https://orcid.org/0000-0001-5461-8680
Burnett, Edmund K.

Zhang, Lei https://orcid.org/0000-0002-0162-7222
Aspuru-Guzik, Alán

Houk, K. N. https://orcid.org/0000-0002-8387-5261
Briseno, Alejandro L. https://orcid.org/0000-0003-2981-9143
Funding

Funding for this research was provided by:

Office of Naval Research (N000147-14-1-0053)

National Natural Science Foundation of China (21672020)

Division of Materials Research (1508627, 1335645)

U.S. Department of Energy (DE-SC0015959)

Division of Chemistry (CHE-1048804)

National Center for Research Resources (S10RR025631)
License Information

Accepted Manuscript valid from 2019-01-15
More Information

SIMILARITY CHECK

: This document is Similarity Check deposited

RELATED DATA

: Supplementary Information

: Crystal Structure Data

IDENTIFIERS

: Steven A. Lopez (ORCID)

: Janice B. Lin (ORCID)

: Hyunbok Lee (ORCID)

: Lei Zhang (ORCID)

: K. N. Houk (ORCID)

: Alejandro L. Briseno (ORCID)

PEER REVIEW METHOD

: Single-blind

PUBLICATION HISTORY

: Received 15 December 2017; Accepted 12 January 2018; Accepted Manuscript published 15 January 2018; Advance Article published 29 January 2018; Version of Record published 5 April 2018