Crossmark

Three applications of ultrafast transient absorption spectroscopy of semiconductor thin films: spectroelectrochemistry, microscopy, and identification of thermal contributions

Crossref DOI link: https://doi.org/10.1039/C8TC02977F

Published Online: 2018

Update policy: https://doi.org/10.1039/rsc_crossmark_policy

Authors

Knowles, Kathryn E. https://orcid.org/0000-0001-6315-6473
Koch, Melissa D. https://orcid.org/0000-0003-4938-6736
Shelton, Jacob L. https://orcid.org/0000-0002-7802-5545
Funding

Funding for this research was provided by:

University of Rochester
License Information

Accepted Manuscript valid from 2019-07-30
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SIMILARITY CHECK

: This document is Similarity Check deposited

IDENTIFIERS

: Kathryn E. Knowles (ORCID)

: Melissa D. Koch (ORCID)

: Jacob L. Shelton (ORCID)

PEER REVIEW METHOD

: Single-blind

PUBLICATION HISTORY

: Received 17 June 2018; Accepted 30 July 2018; Accepted Manuscript published 30 July 2018; Advance Article published 7 August 2018; Version of Record published 15 November 2018

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