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Ring defects in n-type Czochralski-grown silicon: A high spatial resolution study using Fourier-transform infrared spectroscopy, micro-photoluminescence, and micro-Raman

Crossref DOI link: https://doi.org/10.1063/1.5057724

Published Online: 2018-12-26

Published Print: 2018-12-28

Update policy: https://doi.org/10.1063/aip-crossmark-policy-page

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