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Bipolar resistive switching property of Si<sub>3</sub>N<sub>4−x</sub>thin films depending on N deficiency

Published Online: 2020

Authors

Kwon, Dae Eun

Kim, Yumin

Kim, Hae Jin

Kwon, Young Jae

Woo, Kyung Seok

Yoon, Jung Ho

Hwang, Cheol Seong https://orcid.org/0000-0002-6254-9758
Funding

Funding for this research was provided by:

Ministry of Trade, Industry and Energy (20003655)
License Information

Accepted Manuscript valid from 2020-12-09
More Information

SIMILARITY CHECK

: This document is Similarity Check deposited

RELATED DATA

: Supplementary Information

IDENTIFIERS

: Cheol Seong Hwang (ORCID)

PEER REVIEW METHOD

: Single-blind

PUBLICATION HISTORY

: Received 29 September 2019; Accepted 7 December 2019; Accepted Manuscript published 9 December 2019; Advance Article published 2 January 2020; Version of Record published 6 February 2020

Document is current