Crossmark

Evolution of short-range order in chemically and physically grown thin film bilayer structures for electronic applications

Crossref DOI link: https://doi.org/10.1039/D0NR01847C

Published Online: 2020

Update policy: https://doi.org/10.1039/rsc_crossmark_policy

Authors

Dippel, Ann-Christin https://orcid.org/0000-0003-1735-9215
Gutowski, Olof

Klemeyer, Lars https://orcid.org/0000-0003-1103-8103
Boettger, Ulrich

Berg, Fenja

Schneller, Theodor

Hardtdegen, Alexander https://orcid.org/0000-0001-7918-4057
Aussen, Stephan https://orcid.org/0000-0001-9083-5404
Hoffmann-Eifert, Susanne

Zimmermann, Martin v.
Funding

Funding for this research was provided by:

Helmholtz Association

Deutsche Forschungsgemeinschaft (SFB 917)

Bundesministerium für Bildung und Forschung (NEUROTEC (16ES1133K))
License Information

Accepted Manuscript valid from 2021-06-16
More Information

SIMILARITY CHECK

: This document is Similarity Check deposited

RELATED DATA

: Supplementary Information

IDENTIFIERS

: Ann-Christin Dippel (ORCID)

: Lars Klemeyer (ORCID)

: Alexander Hardtdegen (ORCID)

: Stephan Aussen (ORCID)

: Susanne Hoffmann-Eifert (ResearcherID)

PEER REVIEW METHOD

: Single-blind

PUBLICATION HISTORY

: Received 4 March 2020; Accepted 18 May 2020; Advance Article published 16 June 2020; Version of Record published 25 June 2020