Crossmark

Characterizing electronic and atomic structures for amorphous and molecular metal oxide catalysts at functional interfaces by combining soft X-ray spectroscopy and high-energy X-ray scattering

Crossref DOI link: https://doi.org/10.1039/D0NR02350G

Published Online: 2020

Update policy: https://doi.org/10.1039/rsc_crossmark_policy

Authors

Tiede, David M. https://orcid.org/0000-0002-2784-4954
Kwon, Gihan https://orcid.org/0000-0002-7963-2136
He, Xiang https://orcid.org/0000-0002-2427-9048
Mulfort, Karen L. https://orcid.org/0000-0002-3132-1179
Martinson, Alex B. F. https://orcid.org/0000-0003-3916-1672
Funding

Funding for this research was provided by:

Brookhaven National Laboratory (DE-SC0012704)

U.S. Department of Energy (DE-AC02-06CH11357)

Argonne National Laboratory (DE-AC02-06CH11357)
License Information

Accepted Manuscript valid from 2021-06-22
More Information

SIMILARITY CHECK

: This document is Similarity Check deposited

IDENTIFIERS

: David M. Tiede (ORCID)

: Gihan Kwon (ORCID)

: Xiang He (ORCID)

: Karen L. Mulfort (ORCID)

: Alex B. F. Martinson (ORCID)

PEER REVIEW METHOD

: Single-blind

PUBLICATION HISTORY

: Received 23 March 2020; Accepted 3 June 2020; Advance Article published 22 June 2020; Version of Record published 2 July 2020

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