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Modified inverted selective plane illumination microscopy for sub-micrometer imaging resolution in polydimethylsiloxane soft lithography devices

Crossref DOI link: https://doi.org/10.1039/D0LC00598C

Published Online: 2020

Update policy: https://doi.org/10.1039/rsc_crossmark_policy

Authors

Xu, Tienan

Lim, Yean Jin https://orcid.org/0000-0003-1874-2662
Zheng, Yujie

Jung, MoonSun

Gaus, Katharina

Gardiner, Elizabeth E. https://orcid.org/0000-0001-9453-9688
Lee, Woei Ming https://orcid.org/0000-0002-3912-6095
Funding

Funding for this research was provided by:

Australian Research Council (DE160100843, DP190100039, DP200100364)

Australian National University (15MEC36, 16MEC26)
License Information

Accepted Manuscript valid from 2021-09-08
More Information

SIMILARITY CHECK

: This document is Similarity Check deposited

RELATED DATA

: Supplementary Information

IDENTIFIERS

: Yean Jin Lim (ORCID)

: Elizabeth E. Gardiner (ORCID)

: Woei Ming Lee (ORCID)

: Woei Ming Lee (ResearcherID)

PEER REVIEW METHOD

: Single-blind

PUBLICATION HISTORY

: Received 10 June 2020; Accepted 7 September 2020; Accepted Manuscript published 8 September 2020; Advance Article published 17 September 2020; Version of Record published 27 October 2020