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Characterization of defect levels in β-Ga<sub>2</sub>O<sub>3</sub> single crystals doped with tantalum

Crossref DOI link: https://doi.org/10.1039/D0CE01639J

Published Online: 2021

Update policy: https://doi.org/10.1039/rsc_crossmark_policy

Authors

Liu, Haoyue

Zhang, Naiji

Yin, Junhua

Xia, Changtai https://orcid.org/0000-0001-5440-5407
Feng, Zhe Chuan

He, Kaiyan

Wan, Lingyu https://orcid.org/0000-0002-9718-5595
Mohamed, H. F. https://orcid.org/0000-0001-6000-3084
Funding

Funding for this research was provided by:

National Natural Science Foundation of China (51868002, 51802327, 51972319)

Science and Technology Commission of Shanghai Municipality ((19520744400))
License Information

Accepted Manuscript valid from 2022-03-03
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SIMILARITY CHECK

: This document is Similarity Check deposited

IDENTIFIERS

: Changtai Xia (ORCID)

: Lingyu Wan (ORCID)

: Lingyu Wan (ResearcherID)

: H. F. Mohamed (ORCID)

PEER REVIEW METHOD

: Single-blind

PUBLICATION HISTORY

: Received 12 November 2020; Accepted 2 March 2021; Accepted Manuscript published 3 March 2021; Advance Article published 31 March 2021; Version of Record published 20 April 2021