Metrology for 2D materials: a perspective review from the international roadmap for devices and systems
Crossref DOI link: https://doi.org/10.1039/D3NA01148H
Published Online: 2024
Update policy: https://doi.org/10.1039/rsc_crossmark_policy
Celano, Umberto https://orcid.org/0000-0002-2856-3847
Schmidt, Daniel https://orcid.org/0000-0002-4665-8137
Beitia, Carlos
Orji, George
Davydov, Albert V.
Obeng, Yaw https://orcid.org/0000-0002-4880-1689
Version of Record valid from 2024-04-08
