Contact line dynamics modulated by electrode roughness determines bubble detachment size
Crossref DOI link: https://doi.org/10.1039/D5CC02994E
Published Online: 2025
Update policy: https://doi.org/10.1039/rsc_crossmark_policy
Yang, Weikang https://orcid.org/0009-0000-9857-2581
Gu, Dongxu
Liu, Xin
Luo, Qiangmin
Accepted Manuscript valid from 2026-07-01
