Pulse-by-pulse depth profile measurement of femtosecond laser ablation on copper
Crossref DOI link: https://doi.org/10.1007/s00339-018-1694-2
Published Online: 2018-02-21
Published Print: 2018-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tani, Shuntaro http://orcid.org/0000-0003-0608-7410
Kobayashi, Yohei
Text and Data Mining valid from 2018-02-21
Article History
Received: 8 January 2018
Accepted: 19 February 2018
First Online: 21 February 2018