Circuit modeling of the electro-thermal behavior of nanoscale bulk-FinFETs
Crossref DOI link: https://doi.org/10.1007/s10825-017-1058-8
Published Online: 2017-09-13
Published Print: 2018-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jeon, Jongwook
Jhon, Hee-Sauk
Kang, Myounggon http://orcid.org/0000-0003-4132-0038
Funding for this research was provided by:
National Research Foundation of Korea (2016R1D1A3B03933150)
the Ministry of Science, ICT and Future Planning (2017M1A7A1A01016265)
License valid from 2017-09-13