Impact analysis of statistical variability on the accuracy of a propagation delay time compact model in nano-CMOS technology
Crossref DOI link: https://doi.org/10.1007/s10825-017-1108-2
Published Online: 2017-12-04
Published Print: 2018-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jooypa, Hamed
Dideban, Daryoosh http://orcid.org/0000-0002-6645-1344
License valid from 2017-12-04