Schmitt, R.H.
Peterek, M.
Morse, E.
Knapp, W.
Galetto, M.
Härtig, F.
Goch, G.
Hughes, B.
Forbes, A.
Estler, W.T.
This article is maintained by: Elsevier
Article Title: Advances in Large-Scale Metrology – Review and future trends
Journal Title: CIRP Annals
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.cirp.2016.05.002
Content Type: article
Copyright: © 2016 CIRP.