Zhilyaev, Alexander P.
Sergeev, Semyon N.
Langdon, Terence G.
This article is maintained by: Elsevier
Article Title: Electron backscatter diffraction (EBSD) microstructure evolution in HPT copper annealed at a low temperature
Journal Title: Journal of Materials Research and Technology
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.jmrt.2014.06.008
Content Type: article
Copyright: Copyright © 2014 Brazilian Metallurgical, Materials and Mining Association. Published by Elsevier Editora Ltda.