Cho, Edward Namkyu
Shin, Yong Hyeon
Yun, Ilgu
Funding for this research was provided by:
IT R&D program of MKE/KEIT
This article is maintained by: Elsevier
Article Title: An analytical avalanche breakdown model for double gate MOSFET
Journal Title: Microelectronics Reliability
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.microrel.2014.08.019
Content Type: article
Copyright: Copyright © 2014 Elsevier Ltd. All rights reserved.