Hagi, Hiroaki
Iwahori, Yuji
Fukui, Shinji
Adachi, Yoshinori
Bhuyan, M.K.
This article is maintained by: Elsevier
Article Title: Defect Classification of Electronic Circuit Board Using SVM based on Random Sampling
Journal Title: Procedia Computer Science
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.procs.2014.08.218
Content Type: article
Copyright: Copyright © 2014 Published by Elsevier B.V.