Kazemi Esfeh, B.
Makovejev, S.
Basso, Didier
Desbonnets, Eric
Kilchytska, V.
Flandre, D.
Raskin, J.-P.
This article is maintained by: Elsevier
Article Title: RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers
Journal Title: Solid-State Electronics
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.sse.2016.10.035
Content Type: article
Copyright: © 2016 Elsevier Ltd. All rights reserved.