Bae, Min Soo
Park, Chuntaek
Shin, Dongseok
Lee, Sang Myung
Yun, Ilgu
Funding for this research was provided by:
LG Display
Institute of BioMed-IT, Energy-IT, and Smart-IT Technology
Brain Korea 21 plus program, Yonsei University
This article is maintained by: Elsevier
Article Title: Effects of mechanical stresses on the reliability of low-temperature polycrystalline silicon thin film transistors for foldable displays
Journal Title: Solid-State Electronics
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.sse.2017.04.003
Content Type: article
Copyright: © 2017 Elsevier Ltd. All rights reserved.