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Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope

Crossref DOI link: https://doi.org/10.1016/j.ultramic.2014.09.005

Published Print: 2015-01

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Authors

Brodusch, Nicolas

Demers, Hendrix

Gauvin, Raynald
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Article Title: Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope

Journal Title: Ultramicroscopy

CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.ultramic.2014.09.005

Content Type: article

Copyright: Copyright © 2014 Elsevier B.V. All rights reserved.