Taillon, Joshua A.
Pellegrinelli, Christopher
Huang, Yi-Lin
Wachsman, Eric D.
Salamanca-Riba, Lourdes G.
Funding for this research was provided by:
National Institute of Standards and Technology (DGE1322106, DEFE0009084)
National Stroke Foundation (DGE1322106, DEFE0009084)
National Institute of Standards and Technology (DGE1322106, DEFE0009084)
U.S. Department of Energy (DGE1322106, DEFE0009084)
Center for Nanoscale Science and Technology (DGE1322106, DEFE0009084)
This article is maintained by: Elsevier
Article Title: Improving microstructural quantification in FIB/SEM nanotomography
Journal Title: Ultramicroscopy
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.ultramic.2017.07.017
Content Type: article
Copyright: © 2017 Elsevier B.V. All rights reserved.