Ka, Jihyun
Cho, Edward Namkyu
Lee, Min-Jung
Myoung, Jae-Min
Yun, Ilgu
This article is maintained by: Elsevier
Article Title: Electrode metal penetration of amorphous indium gallium zinc oxide semiconductor thin film transistors
Journal Title: Current Applied Physics
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.cap.2015.03.004
Content Type: article
Copyright: Copyright © 2015 Elsevier B.V. All rights reserved.