El-Maleh, Aiman H.
Al-Qahtani, Ayed S.
This article is maintained by: Elsevier
Article Title: A finite state machine based fault tolerance technique for sequential circuits
Journal Title: Microelectronics Reliability
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.microrel.2013.10.022
Content Type: article
Copyright: Copyright © 2013 Elsevier Ltd. All rights reserved.