de Lima Filho, Joaquim Brasil
Hidalgo, Ángel Alberto
Funding for this research was provided by:
UFPI
FAPEPI
INEO
CAPES
CNPq
This article is maintained by: Elsevier
Article Title: Film thickness by interference pattern and optical characterization of polyaniline by spectroscopic ellipsometry
Journal Title: Synthetic Metals
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.synthmet.2016.11.025
Content Type: article
Copyright: © 2016 Elsevier B.V. All rights reserved.