Grenier, A.
Duguay, S.
Barnes, J.P.
Serra, R.
Haberfehlner, G.
Cooper, D.
Bertin, F.
Barraud, S.
Audoit, G.
Arnoldi, L.
Cadel, E.
Chabli, A.
Vurpillot, F.
Funding for this research was provided by:
Recherche Technologique de Base
French National Agency (APTITUDE ANR-12-NANO-0001)
This article is maintained by: Elsevier
Article Title: 3D analysis of advanced nano-devices using electron and atom probe tomography
Journal Title: Ultramicroscopy
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.ultramic.2013.10.001
Content Type: article
Copyright: Copyright © 2013 Elsevier B.V. All rights reserved.