A study of the T2 defect and the emission properties of the E3 deep level in annealed melt grown ZnO single crystals
Crossref DOI link: https://doi.org/10.1063/1.4796139
Published Online: 2013-03-22
Published Print: 2013-03-28
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Mtangi, W.
Schmidt, M.
Auret, F. D.
Meyer, W. E.
Janse van Rensburg, P. J.
Diale, M.
Nel, J. M.
Das, A. G. M.
Ling, F. C. C.
Chawanda, A.