Analysis of microstructural induced enhancement of electromechanical coupling in soft dielectrics
Crossref DOI link: https://doi.org/10.1063/1.4801775
Published Online: 2013-04-15
Published Print: 2013-04-15
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Rudykh, Stephan
Lewinstein, Arnon
Uner, Gil
deBotton, Gal
Funding for this research was provided by:
Israel Science Foundation (1246/11)