Vacancies and defect levels in III–V semiconductors
Crossref DOI link: https://doi.org/10.1063/1.4818484
Published Online: 2013-08-13
Published Print: 2013-08-14
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Tahini, H. A.
Chroneos, A.
Murphy, S. T.
Schwingenschlögl, U.
Grimes, R. W.