Extended X-ray absorption fine structure spectroscopy of selenium-hyperdoped silicon
Crossref DOI link: https://doi.org/10.1063/1.4824279
Published Online: 2013-10-04
Published Print: 2013-10-07
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Newman, Bonna K.
Ertekin, Elif
Sullivan, Joseph T.
Winkler, Mark T.
Marcus, Matthew A.
Fakra, Sirine C.
Sher, Meng-Ju
Mazur, Eric
Grossman, Jeffrey C.
Buonassisi, Tonio