Microstructure of highly strained BiFeO3 thin films: Transmission electron microscopy and electron-energy loss spectroscopy studies
Crossref DOI link: https://doi.org/10.1063/1.4863778
Published Online: 2014-01-30
Published Print: 2014-01-28
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Heon Kim, Young
Bhatnagar, Akash
Pippel, Eckhard
Alexe, Marin
Hesse, Dietrich
Funding for this research was provided by:
DFG (SFB 762)