Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response
Crossref DOI link: https://doi.org/10.1063/1.4875836
Published Online: 2014-05-13
Published Print: 2014-05-14
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Miccio, Luis A.
Kummali, Mohammed M.
Schwartz, Gustavo A.
Alegría, Ángel
Colmenero, Juan