Diffusion and impurity segregation in hydrogen-implanted silicon carbide
Crossref DOI link: https://doi.org/10.1063/1.4882996
Published Online: 2014-06-11
Published Print: 2014-06-14
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Barcz, A.
Kozubal, M.
Jakieła, R.
Ratajczak, J.
Dyczewski, J.
Gołaszewska, K.
Wojciechowski, T.
Celler, G. K.