Grain growth, anomalous scaling, and grain boundary grooving in polycrystalline CdTe thin films
Crossref DOI link: https://doi.org/10.1063/1.4901068
Published Online: 2014-11-10
Published Print: 2014-11-14
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Kwon, Dohyoung
Shim, Yunsic
Amar, Jacques G.
Compaan, Alvin D.
Funding for this research was provided by:
National Science Foundation (CHE-0840474, DMR-0907399)