Temperature dependent quasi-static capacitance-voltage characterization of SiO2/β-Ga2O3 interface on different crystal orientations
Crossref DOI link: https://doi.org/10.1063/1.4991400
Published Online: 2017-09-21
Published Print: 2017-09-18
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Zeng, Ke
Singisetti, Uttam http://orcid.org/0000-0003-1190-7815
Funding for this research was provided by:
National Science Foundation (ECCS 1607833)