Electrical characterization of atomic layer deposited Al2O3/InN interfaces
Crossref DOI link: https://doi.org/10.1116/1.4936928
Published Online: 2015-12-02
Published Print: 2016-01-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Jia, Ye
Dabiran, Amir M.
Singisetti, Uttam
Funding for this research was provided by:
Office of Naval Research (N000141310214)