Crossmark

Engineering thermal and electrical interface properties of phase change memory with monolayer MoS2

Crossref DOI link: https://doi.org/10.1063/1.5080959

Published Online: 2019-02-27

Published Print: 2019-02-25

Update policy: https://doi.org/10.1063/aip-crossmark-policy-page

Authors

Neumann, Christopher M. https://orcid.org/0000-0002-4705-9478
Okabe, Kye L. https://orcid.org/0000-0002-2561-4979
Yalon, Eilam https://orcid.org/0000-0001-7965-459X
Grady, Ryan W. https://orcid.org/0000-0002-0457-5026
Wong, H.-S. Philip https://orcid.org/0000-0002-0096-1472
Pop, Eric https://orcid.org/0000-0003-0436-8534
Funding

Funding for this research was provided by:

National Science Foundation (1542152)

National Science Foundation (1542883)

National Science Foundation (DGE-1656518)

Semiconductor Research Corporation (2826)