Aberration-insensitive microscopy using optical field-correlation imaging
Crossref DOI link: https://doi.org/10.1063/1.5091976
Published Online: 2019-06-14
Published Print: 2019-06-01
Update policy: https://doi.org/10.1063/aip-crossmark-policy-page
Ilina, E.
Nyman, M. http://orcid.org/0000-0002-9661-6461
Švagždytė, I.
Chekurov, N.
Kaivola, M. http://orcid.org/0000-0001-5047-5846
Setälä, T.
Shevchenko, A.
Funding for this research was provided by:
Academy of Finland (308394)