XPS depth profiling and leakage properties of anodized titania dielectrics and their application in high-density capacitors
Crossref DOI link: https://doi.org/10.1007/s10853-015-9320-6
Published Online: 2015-08-06
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chakraborti, Parthasarathi
Sharma, Himani
Pulugurtha, Markondeya Raj
Tummala, Rao
Text and Data Mining valid from 2015-08-06