Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method
Crossref DOI link: https://doi.org/10.1007/s11082-017-1057-9
Published Online: 2017-06-03
Published Print: 2017-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fang, Y. http://orcid.org/0000-0002-1632-1816
Jayasuriya, D.
Furniss, D.
Tang, Z. Q.
Sojka, Ł.
Markos, C.
Sujecki, S.
Seddon, A. B.
Benson, T. M.
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